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27 January 1989 Spectral Correlation Of Semiconductor Lasers
Peter T. Johnson, John E. Carroll
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Proceedings Volume 0965, Current Developments in Optical Engineering III; (1989) https://doi.org/10.1117/12.948021
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States
Abstract
A novel technique for measuring the spectral properties of single-mode, semiconductor lasers for use in coherent optical communication systems is being explored. Unlike conventional linewidth/lineshape measurements both amplitude and phase information is retained in a complex spectral correlation function. In principle this should give additional insight into both the amplitude noise and phase noise processes within the laser that determine lineshape. The paper discusses the method and the problems involved.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Peter T. Johnson and John E. Carroll "Spectral Correlation Of Semiconductor Lasers", Proc. SPIE 0965, Current Developments in Optical Engineering III, (27 January 1989); https://doi.org/10.1117/12.948021
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KEYWORDS
Semiconductor lasers
Crystals
Optical engineering
Signal detection
Interferometers
Optical communications
Phase shifts
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