In process metrology of aspheric optical surfaces during sub-aperture polishing process

L. M. Pant; M. P. Singh; K. K. Pant; A. Ghosh

doi:10.1117/12.2182846

15 June 2015 In process metrology of aspheric optical surfaces during sub-aperture polishing process

L. M. Pant, M. P. Singh, K. K. Pant, A. Ghosh

Author Affiliations +

Proceedings Volume 9654, International Conference on Optics and Photonics 2015; 96540U (2015) https://doi.org/10.1117/12.2182846
Event: International Conference on Optics and Photonics 2015, 2015, Kolkata, India

Abstract

The fabrication of complex aspheric and freeform surfaces are possible with accurate iterative metrology feedback during correcting polishing process. The tool path of the machine is generated based on the measured surface data for corrective material removal. The computer controlled polishing machines are compatible with various metrology tools. This paper presents annular null based interferometric in- process metrology for deterministic corrective polishing for aspheric surface of infrared optical material.

Citation Download Citation

L. M. Pant, L. M. Pant, M. P. Singh, M. P. Singh, K. K. Pant, K. K. Pant, A. Ghosh, A. Ghosh, } "In process metrology of aspheric optical surfaces during sub-aperture polishing process", Proc. SPIE 9654, International Conference on Optics and Photonics 2015, 96540U (15 June 2015); doi: 10.1117/12.2182846; https://doi.org/10.1117/12.2182846

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