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15 June 2015In process metrology of aspheric optical surfaces during sub-aperture polishing process
The fabrication of complex aspheric and freeform surfaces are possible with accurate iterative metrology feedback
during correcting polishing process. The tool path of the machine is generated based on the measured surface data
for corrective material removal. The computer controlled polishing machines are compatible with various metrology
tools. This paper presents annular null based interferometric in- process metrology for deterministic corrective
polishing for aspheric surface of infrared optical material.
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L. M. Pant, M. P. Singh, K. K. Pant, A. Ghosh, "In process metrology of aspheric optical surfaces during sub-aperture polishing process," Proc. SPIE 9654, International Conference on Optics and Photonics 2015, 96540U (15 June 2015); https://doi.org/10.1117/12.2182846