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15 June 2015 In process metrology of aspheric optical surfaces during sub-aperture polishing process
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Proceedings Volume 9654, International Conference on Optics and Photonics 2015; 96540U (2015) https://doi.org/10.1117/12.2182846
Event: International Conference on Optics and Photonics 2015, 2015, Kolkata, India
Abstract
The fabrication of complex aspheric and freeform surfaces are possible with accurate iterative metrology feedback during correcting polishing process. The tool path of the machine is generated based on the measured surface data for corrective material removal. The computer controlled polishing machines are compatible with various metrology tools. This paper presents annular null based interferometric in- process metrology for deterministic corrective polishing for aspheric surface of infrared optical material.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. M. Pant, M. P. Singh, K. K. Pant, and A. Ghosh "In process metrology of aspheric optical surfaces during sub-aperture polishing process", Proc. SPIE 9654, International Conference on Optics and Photonics 2015, 96540U (15 June 2015); https://doi.org/10.1117/12.2182846
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