1 July 2015 Sensing nanometric displacement of a micro-/nano-fiber induced by optical forces by use of white light interferometry
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Proceedings Volume 9655, Fifth Asia-Pacific Optical Sensors Conference; 96552J (2015) https://doi.org/10.1117/12.2184393
Event: Fifth Asia Pacific Optical Sensors Conference, 2015, Jeju, Korea, Republic of
Abstract
Sensing the nanometric displacement of a micro-/nano-fiber induced by optical forces is a key technology to study optical forces and optical momentum. When the gap between a micro-/nano-fiber and glass substrate becomes down to micrometer scale or less, a white light interference was observed. The gap changes when optical force arising from the propagating pump light along the micro-/nano-fiber causes a transversal nanometric displacement of a micro-/nanofiber, resulting in movement of the interferometric fringes. Therefore this movement of the interferometric fringes can be used to sense the nanometric displacement of the micro-/nano-fiber induced by optical forces. Experimental results show that the resolutions of this method can reach 7.27nm/pixel for tilted angle 0.8o between the micro-/nano-fiber and substrate. It is concluded that the white light interferometry method is suitable for measuring the weak optical force.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weiqia Qiu, Weiqia Qiu, Hankai Huang, Hankai Huang, Jianhui Yu, Jianhui Yu, Huazhuo Dong, Huazhuo Dong, Zhe Chen, Zhe Chen, Huihui Lu, Huihui Lu, } "Sensing nanometric displacement of a micro-/nano-fiber induced by optical forces by use of white light interferometry", Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96552J (1 July 2015); doi: 10.1117/12.2184393; https://doi.org/10.1117/12.2184393
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