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1 July 2015 Metal ion sensing solution containing double crossover DNA
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Proceedings Volume 9655, Fifth Asia-Pacific Optical Sensors Conference; 96553A (2015)
Event: Fifth Asia Pacific Optical Sensors Conference, 2015, Jeju, Korea, Republic of
The current study describes metal ion sensing with double crossover DNAs (DX1 and DX2), artificially designed as a platform of doping. The sample for sensing is prepared by a facile annealing method to grow the DXs lattice on a silicon/silicon oxide. Adding and incubating metal ion solution with the sensor substrate into the micro-tube lead the optical property change. Photoluminescence (PL) is employed for detecting the concentration of metal ion in the specimen. We investigated PL emission for sensor application with the divalent copper. In the range from 400 to 650 nm, the PL features of samples provide significantly different peak positions with excitation and emission detection. Metal ions contribute to modify the optical characteristics of DX with structural and functional change, which results from the intercalation of them into hydrogen bonding positioned at the center of double helix. The PL intensity is decreased gradually after doping copper ion in the DX tile on the substrate.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Byeongho Park, Sreekantha Reddy Dugasani, Youngho Cho, Juyeong Oh, Chulki Kim, Min Ah Seo, Taikjin Lee, Young Miin Jhon, Deok Ha Woo, Seok Lee, Seong Chan Jun, Sung Ha Park, and Jae Hun Kim "Metal ion sensing solution containing double crossover DNA", Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96553A (1 July 2015);

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