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24 August 2015 Monitoring of cadmium influence on ultra short-term growth dynamics of plants using a highly sensitive interferometric technique, SIT
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Proceedings Volume 9660, SPECKLE 2015: VI International Conference on Speckle Metrology; 96600A (2015) https://doi.org/10.1117/12.2196866
Event: SPECKLE 2015: VI International Conference on Speckle Metrology, 2015, Guanajuato, Mexico
Abstract
Cadmium(Cd) is an environmental contaminant heavy metal having high toxicity. The aim of this study is to investigate the effect of Cd on growth dynamics of plants in the order of sub-nanometers, using a novel optical interference technique, named as Statistical Interferometry Technique(SIT). In this study, a special attention is paid to the short-term growth fluctuation in measurements of the in-plane displacement of the leaf. In the experiments, Chinese chives(Allium Tuberosum) were used as samples, and the growth and its nanometric growth fluctuations were measured for Cd exposure. This nanometric fluctuation that was found in our previous study, is an intrinsic property of the plant and is referred to as nanometric intrinsic fluctuations(NIF). The effect of Cd on plant growth fluctuation, i.e., NIF of growth rate was observed for three days continuously by exposing their roots to four CdCl2 concentrations 0, 0.001, 0.01, and 0.1mM. The standard deviation(SD) of NIF of healthy leaf was 4.0nm/mm sec, and it reduced to 3.1nm/mm sec and 1.8nm/mm sec after 6 hours and 54 hours after exposing to 0.1mM Cd, respectively. For smaller concentration of 0.01mM, less reduction in SD of NIF was confirmed compared to those for 0.1mM. In addition, under 0.001mM, a significant recovery could be observed after a rapid reduction in the first 6 hours. The results imply that NIF can be a measure for heavy metal stress and is sensitive enough to detect the influence of smaller amount of Cd(from 0.001mM to 0.1mM) on plants in a very early stage.
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Kokge Thilini Kanchana Muthumali De Silva and Hirofumi Kadono "Monitoring of cadmium influence on ultra short-term growth dynamics of plants using a highly sensitive interferometric technique, SIT", Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 96600A (24 August 2015); https://doi.org/10.1117/12.2196866
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