Finding small displacements of recorded speckle patterns: revisited

Steen G. Hanson; Michael Linde Jakobsen; Maumita Chakrabarti; H. T. Yura

doi:10.1117/12.2195631

24 August 2015 Finding small displacements of recorded speckle patterns: revisited

Steen G. Hanson, Michael Linde Jakobsen, Maumita Chakrabarti, H. T. Yura

Proceedings Volume 9660, SPECKLE 2015: VI International Conference on Speckle Metrology; 96601J (2015) https://doi.org/10.1117/12.2195631
Event: SPECKLE 2015: VI International Conference on Speckle Metrology, 2015, Guanajuato, Mexico

Abstract

An analytical expression for the bias effect in digital speckle correlation is derived based on a Gaussian approximation of the spatial pixel size and array extent. The evaluation is carried out having assumed an incident speckle field. The analysis is focused on speckle displacements in the order of one pixel, thus having no speckle decorrelation. Furthermore, sensitivity is a main issue wherefore we need speckles close to the pixel size, which means that speckle averaging becomes important, and that Nyquist’s criteria may not be fulfilled. Based on these observations, a new correlation method is introduced, which alleviates the need to know the expected shape of the crosscovariance between the original and the off-set recorded speckle pattern. This concept calls for correlating the crosscovariance with the auto covariance, which essentially carries information on the expected shape of the crosscovariance.

Citation Download Citation

Steen G. Hanson, Michael Linde Jakobsen, Maumita Chakrabarti, and H. T. Yura "Finding small displacements of recorded speckle patterns: revisited", Proc. SPIE 9660, SPECKLE 2015: VI International Conference on Speckle Metrology, 96601J (24 August 2015); https://doi.org/10.1117/12.2195631

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KEYWORDS

Speckle

Speckle pattern

Detector arrays

Fourier transforms

Algorithm development

Detection and tracking algorithms

Error analysis

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