Translator Disclaimer
Paper
11 September 2015 Raman studies of C-Ni/Ti films deposited on Si (100)
Author Affiliations +
Proceedings Volume 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015; 966249 (2015) https://doi.org/10.1117/12.2205546
Event: XXXVI Symposium on Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments (Wilga 2015), 2015, Wilga, Poland
Abstract
The thin films of carbon-nickel (C-Ni) nanocoposites were deposited on Ti-evaporated Si (100) substrate using Physical Vapour Deposition (PVD) method. Influence of evaporated titanium on carbonaceous structure of C-Ni films were investigated by Raman spectroscopy method. The fullerite-graphite structure was recognize using principal component analysis (PCA) of obtained Raman spectra.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Belka, J. Keczkowska, M. Suchańska, P. Firek, H. Wronka, J. Radomska, and E. Czerwosz "Raman studies of C-Ni/Ti films deposited on Si (100)", Proc. SPIE 9662, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2015, 966249 (11 September 2015); https://doi.org/10.1117/12.2205546
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
Back to Top