20 November 2015 Front Matter: Volume 9667
Proceedings Volume 9667, International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors; 966701 (2015) https://doi.org/10.1117/12.2229403
Event: International Workshop on Thin Films for Electronics, Electro-Optics, Energy and Sensors, 2015, Suzhou, China
This PDF file contains the front matter associated with SPIE Proceedings Volume 9667, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors, edited by Guru Subramanyam, Proceedings of SPIE Vol. 9667 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781628418866

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Cerny, Charles, 05

Chen, Dong, 0T

Chen, Linsen, 07, 0C

Dong, Ruili, 0T

Feng, Fanrong, 0B

Gao, Fei, 0B

Gu, Xinyu, 0C

Guo, Leping, 0E

Gupta, Reema, 03

Gupta, Vinay, 03, 06

He, Hong, 0T

Jiang, Yingjie, 07

Kaur, Gurpreet, 06

Leedy, Kevin, 05

Liu, Peng, 0D

Mei, Qijing, 0D

Ning, Ning, 02

Ogudo, Kingsley A., 02

Peng, Changsi, 07

Polleux, Jean-Luc, 02

Qiu, Shanming, 0F

Qiu, Zhiwei, 0F

Quach, Tony, 05

Rui, Guanghao, 09

Shen, Donghui, 0G

Shen, Su, 0C

Shi, Zhenwu, 07

Shin, Eunsung, 04, 05

Snyman, Lukas W., 02

Spatz, Devin, 04

Subramanyam, Guru, 04, 05

Tan, Yonghong, 0T

Tang, Minxue, 0D

Tomar, Monika, 03, 06

Wan, Wenqiang, 0C

Wang, Jian, 0A

Wang, Shu, 04, 05

Wang, Weisong, 05

Wang, Xueqin, 0E, 0F

Wu, Jianhong, 0A, 0B

Xie, Bin, 0G

Xu, Kaikai, 02

Xu, Lixiong, 0A

Yang, Zhenyu, 08

Yu, Lingling, 0G

Yu, Qi, 02

Yue, Hailing, 04

Yue, Jianping, 0E, 0F

Yue, Shun, 0E, 0F

Zhan, Qiwen, 08, 09

Zhang, Congyue, 0G

Zhang, Feng, 07

Zhou, Xiaohong, 07

Zong, Liang, 0G

Conference Committee

Conference Chair

  • Guru Subramanyam, University of Dayton (United States)

Conference Co-chairs

  • Chinhua Wang, Soochow University (China)

  • Qiwen Zhan, University of Dayton (United States)

  • Chonglin Chen, The University of Texas at San Antonio (United States)

Conference Review Committee

  • Andrew M. Sarangan, University of Dayton (United States)

  • Andrew J. Steckl, University of Cincinnati (United States)

  • Chonglin Chen, The University of Texas at San Antonio (United States)

  • K. C. James Raju, University of Hyderabad (India)

  • Eunsung Shin, University of Dayton Research Institute (United States)

  • Imad H. Agha, University of Dayton (United States)

  • James G. Grote, Air Force Research Laboratory (United States)

  • Joseph W. Haus, University of Dayton (United States)

  • Karolyn M. Hansen, University of Dayton (United States)

  • Nian X. Sun, Northeastern University (United States)

  • Partha P. Banerjee, University of Dayton (United States)

  • Paul Terrence Murray, University of Dayton Research Institute (United States)

  • Chungkun Song, Dong-A University (Korea, Republic of)

  • Chinhua Wang, Soochow University (China)

  • Wenyan Xu, Yanshan University (China)

  • Keqin Zhang, Soochow University (China)

  • Qiwen Zhan, University of Dayton (United States)

  • Ram Katiyar, University of Puerto Rico (Puerto Rico)

  • Yu Wang, The Hong Kong Polytechnic University (Hong Kong, China)

  • Wen Li, Michigan State University (United States)

  • Nelson Sepulveda, Michigan State University (United States)

  • Jitendra Kumar, University of Dayton (United States)

  • Sandwip Dey, Arizona State University (United States)

  • Weisong Wang, University of Dayton (United States)

  • Wen Lu, Zhejiang Naboor Power Technology Inc. (China)


The inaugural International Workshop on Thin-films for Electronics, Electro-Optics, Energy and Sensors (TFE3S) was successfully held from 4-6 July 2015 at the University of Dayton China Institute (Suzhou, China). This workshop was organized by the University of Dayton, the University of Dayton China Institute, Soochow University, and Nanjing University of Science and Technology. Prof. Guru Subramanyam from the Center of Excellence for Thin-film Research and Surface Engineering (CETRASE), University of Dayton served as program chair. The University of Dayton China Institute and the Dushu Lake Science & Education Development Co. Ltd. provided local logistic services for the workshop. There were 83 participants, which included over 50 invited speakers and three plenary speakers, from the United States, India, Germany, Korea, Japan and China. The workshop set up 11 sessions related to different areas of thin-films. Accepted papers are published by SPIE as a proceedings volume.

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9667", Proc. SPIE 9667, International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors, 966701 (20 November 2015); doi: 10.1117/12.2229403; https://doi.org/10.1117/12.2229403

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