15 October 2015 Research of IRFPAs' reliability evaluation by bad pixel
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Proceedings Volume 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology; 96740H (2015) https://doi.org/10.1117/12.2197321
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China
Abstract
Reliability is an important index to ensure the application of infrared focal plane arrays (IRFPAs) in complex environment, and it becomes a major bottleneck problem of IRFPAs’ development. Because of the characteristics such as type, nature, quantity, location and distribution et al, bad pixel which contains initial bad pixel and used bad pixel has outstanding advantage for failure analysis and reliability evaluation of IRFPAs. In this paper, the structure of IRPFAs has been introduced in detail, and the damage mechanisms of used bad pixel also have been analyzed deeply. At the same time, the feasibility to study IRPFAs' damage stress, failure position, damage mechanism has been discussed all around. The research of bad pixel can be used to optimize the structure and process, meanwhile it also can improve the accuracy of bad pixel identification and replacements.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lichao Hao, Lichao Hao, Aibo Huang, Aibo Huang, Canxiong Lai, Canxiong Lai, Xing Chen, Xing Chen, Mingming Hao, Mingming Hao, Honglei Chen, Honglei Chen, Guoguang Lu, Guoguang Lu, Yun Huang, Yun Huang, Yunfei En, Yunfei En, } "Research of IRFPAs' reliability evaluation by bad pixel", Proc. SPIE 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology, 96740H (15 October 2015); doi: 10.1117/12.2197321; https://doi.org/10.1117/12.2197321
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