Translator Disclaimer
Paper
8 October 2015 Research on the data processing method for the spatially modulated imaging polarimeter
Author Affiliations +
Proceedings Volume 9675, AOPC 2015: Image Processing and Analysis; 967529 (2015) https://doi.org/10.1117/12.2199896
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China
Abstract
The spatially modulated imaging polarimeter is a compact, static and simultaneous polarization imaging system which can collect the interferometric data in real time. By processing the interferometric data, the complete polarization information of the incident light can be demodulated to realize the polarization detection. Based on the device principle of the spatially modulated imaging polarimeter using Savart Plates, the interference pattern processing method in the frequency domain was analyzed. Then, the physical mechanism of the modulation was explained and its corresponding processing method in the spatial domain was analyzed. Finally, in order to evaluate and compare the two methods, the simulation was performed and a prototype of the polarimeter was developed to finish the field experiment. The experimental results show that the spatial processing method can effectively extract the polarization information from the interference pattern. It can identify the artificial targets more clearly from the natural background compared with the frequency-domain processing method.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guanyuan Gong, Xiaobing Sun, Weifeng Yang, and Zhen Liu "Research on the data processing method for the spatially modulated imaging polarimeter", Proc. SPIE 9675, AOPC 2015: Image Processing and Analysis, 967529 (8 October 2015); https://doi.org/10.1117/12.2199896
PROCEEDINGS
11 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Spatial phase-shifting lateral shearing interferometer
Proceedings of SPIE (February 02 2009)
ZIMPOL-3: a powerful solar polarimeter
Proceedings of SPIE (July 15 2010)
Optical characterization of a micro-grid polarimeter
Proceedings of SPIE (June 08 2012)

Back to Top