8 October 2015 Modeling Fizeau interferometer based on ray tracing with Zemax
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Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96770G (2015) https://doi.org/10.1117/12.2197612
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China
Abstract
A convenient method to study the influence of error sources in Fizeau is to build a ray-tracing model to simulate the error sources. In this paper an interferometer model is presented; an extension program is called to simulate the interference; and a preliminary research of several error sources is conducted. These examples demonstrate error analysis based on interferometer models is feasible and provide some guidance for optimizing our interferometer design.
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Yiwei He, Yiwei He, Xi Hou, Xi Hou, Yongqian Wu, Yongqian Wu, Fan Wu, Fan Wu, Haiyang Quan, Haiyang Quan, Fengwei Liu, Fengwei Liu, } "Modeling Fizeau interferometer based on ray tracing with Zemax", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96770G (8 October 2015); doi: 10.1117/12.2197612; https://doi.org/10.1117/12.2197612
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