Use test system of 100GHz photodetector waveform calibrate rise time of oscilloscope

Jianwei Li; Nan Xu; Haiyong Gan; Zhixin Zhang; Molin Zhang

doi:10.1117/12.2199651

8 October 2015 Use test system of 100GHz photodetector waveform calibrate rise time of oscilloscope

Jianwei Li, Nan Xu, Haiyong Gan, Zhixin Zhang, Molin Zhang

Proceedings Volume 9677, AOPC 2015: Optical Test, Measurement, and Equipment; 96771A (2015) https://doi.org/10.1117/12.2199651
Event: Applied Optics and Photonics China (AOPC2015), 2015, Beijing, China

Abstract

Electrooptic sampling has been shown to be a very powerful technique for making time-domain measurements of fast electronic devices and circuits, such as oscilloscope. In this paper, we review the principles of electrooptic sampling technique for electronic waveform probing with applications to characterizing 100GHz photodetector pulse response.

Citation Download Citation

Jianwei Li, Nan Xu, Haiyong Gan, Zhixin Zhang, and Molin Zhang "Use test system of 100GHz photodetector waveform calibrate rise time of oscilloscope", Proc. SPIE 9677, AOPC 2015: Optical Test, Measurement, and Equipment, 96771A (8 October 2015); https://doi.org/10.1117/12.2199651

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