28 October 2016 Process for the Φ130 sapphire window element with long distance and high resolution
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Proceedings Volume 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 96831J (2016) https://doi.org/10.1117/12.2243626
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
With the process test for the choice of materials, the test materials and the molds, the abrasives, the temperature and the different machining process monitoring parameters of the polishing machine, the process method and the quality control technology were figured out for the Φ130 sapphire window element with long distance and high resolution (hereinafter referred to as window element), meantime, the optimum process condition was determined to machine the element. The results were that the high resolution imaging window was processed with the surface roughness Ra of 0.639nm, the transmission distortion of λ/10 (λ=632.8nm), the parallel error of 5″, the resolution of 1.47″ and the focal length of 5 km, which can satisfy the imaging requirements better for the military photoelectric device for sapphire window with long distance and high resolution.
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Zengqi Xu, Zengqi Xu, Ying Su, Ying Su, Jianli Lei, Jianli Lei, Rui Guo, Rui Guo, Feng Zhang, Feng Zhang, Xinlong Guo, Xinlong Guo, Xuanmin Liu, Xuanmin Liu, Taohui Sun, Taohui Sun, } "Process for the Φ130 sapphire window element with long distance and high resolution", Proc. SPIE 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 96831J (28 October 2016); doi: 10.1117/12.2243626; https://doi.org/10.1117/12.2243626
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