27 September 2016 Monitoring PMD in two-dimensional phase diagram for NRZ-DPSK systems using 0.25 bit period delay-tap sampling technique
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Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96840N (2016) https://doi.org/10.1117/12.2239774
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
Our study proposes a method of polarization mode dispersion (PMD) under the influence of optical signal-to-noise-ratio (OSNR) in the two-dimensional phase diagram, while the polarization mode dispersion (PMD) and optical signal-to-noise-ratio (OSNR) exist at the same time, using the controlling variable method. The study is based on 0.25 bit period delay sampling in NRZ-DPSK system, the range of the experimental optical signal-to-noise-ratio (OSNR) is from 10dB to 30dB, polarization mode dispersion (PMD) is from 0 to 20ps√km . The results show that the method can get the linear variation of polarization mode dispersion (PMD) in the two-dimensional phase diagram.
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Xichan Zhang, Yunfeng Peng, Yumin Liu, Tonghui Ji, "Monitoring PMD in two-dimensional phase diagram for NRZ-DPSK systems using 0.25 bit period delay-tap sampling technique", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96840N (27 September 2016); doi: 10.1117/12.2239774; https://doi.org/10.1117/12.2239774
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