27 September 2016 Test technology on CCD anti-sunlight jamming based on complex circumstance
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Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 968410 (2016) https://doi.org/10.1117/12.2243445
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
Visible-light reconnaissance device based on CCD is applied to all kinds of weapons, CCD cannot work because of saturation when it faces intense light. Sun is intense light source in nature and assignably influences CCD performance. In this paper, aim is appraising CCD anti-sunlight ability, object reflection characteristic test system is designed, based on typical background reflection characteristic including grant, sand and so on, complex circumstance is formulated and test project is optimized with orthogonal design method, problem that is without test technology on CCD anti-sunlight jamming is solved.
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Sheng-bing Shi, Sheng-bing Shi, Zhen-xing Chen, Zhen-xing Chen, Fu-li Han, Fu-li Han, } "Test technology on CCD anti-sunlight jamming based on complex circumstance", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968410 (27 September 2016); doi: 10.1117/12.2243445; https://doi.org/10.1117/12.2243445
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