27 September 2016 Design of near-infrared single photon detector at 1550nm wavelength
Author Affiliations +
Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 968414 (2016) https://doi.org/10.1117/12.2244003
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
Technology of near-infrared single photon detection is used in quantum communication, laser ranging and weak light detection. Present single photon detectors are usually expensive and bulky. To overcome their disadvantages, a hand-held single photon detector based on InGaAs/InP avalanche photo diode (APD) is developed. A circuit program for temperature control and bias voltage is offered. The gating signal is generated and the avalanche signal is extracted by FPGA. Experiment results show that, the single photon detector yields only 8.2×10-6/ns dark count rate (DCR) when photon detection efficiency is 12%, and the maximum photon detection efficiency of 16% is obtained at temperature of -55°C.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiali Gao, "Design of near-infrared single photon detector at 1550nm wavelength", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 968414 (27 September 2016); doi: 10.1117/12.2244003; https://doi.org/10.1117/12.2244003
PROCEEDINGS
6 PAGES


SHARE
Back to Top