27 September 2016 Research on effects of baffle position in an integrating sphere on the luminous flux measurement
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Proceedings Volume 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 96841C (2016) https://doi.org/10.1117/12.2245572
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
In the field of optical metrology, luminous flux is an important index to characterize the quality of electric light source. Currently, the majority of luminous flux measurement is based on the integrating sphere method, so measurement accuracy of integrating sphere is the key factor. There are plenty of factors affecting the measurement accuracy, such as coating, power and the position of light source. However, the baffle which is a key part of integrating sphere has important effects on the measurement results. The paper analyzes in detail the principle of an ideal integrating sphere. We use moving rail to change the relative position of baffle and light source inside the sphere. By experiments, measured luminous flux values at different distances between the light source and baffle are obtained, which we used to take analysis of the effects of different baffle position on the measurement. By theoretical calculation, computer simulation and experiment, we obtain the optimum position of baffle for luminous flux measurements. Based on the whole luminous flux measurement error analysis, we develop the methods and apparatus to improve the luminous flux measurement accuracy and reliability. It makes our unifying and transferring work of the luminous flux more accurate in East China and provides effective protection for our traceability system.
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Fangsheng Lin, Tiecheng Li, Dejin Yin, Lei Lai, Ming Xia, "Research on effects of baffle position in an integrating sphere on the luminous flux measurement", Proc. SPIE 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 96841C (27 September 2016); doi: 10.1117/12.2245572; https://doi.org/10.1117/12.2245572
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