25 October 2016 Quality assessment for spectral imaging
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Proceedings Volume 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices; 96860F (2016) https://doi.org/10.1117/12.2240101
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
Recent research in the area of image quality assessment has been focusing almost exclusively on greyscale and color images. The advent of technologies such as remote sensing, biomedical and industrial imaging however demands this research to be extended to multi/hyper spectral images. Spectral imaging has more judging essentials than greyscale or color imaging and its image quality assessment task intends to cover up all-around evaluating factors. This paper presents an integrating spectral imaging quality assessment project, in which spectral-based, spatial-based and radiometric-based quality evaluation behavior for one remote-sensing hyperspectral imager are jointly executed. Spectral response function is worked out and spectral performance is further judged according to its FWHM and spectral excursion value. Spatial quality assessment is worked out by MTF computing with an improved slanted edge analysis method. Radiometric response ability of different spectral channels is judged by SNR computing based upon local RMS extraction and statistics method. Improved noise elimination and parameter optimization method are adopted to improve the evaluation fidelity. This work on spectral imaging quality assessment not only has significance in the development of on-ground and in-orbit spectral imaging technique but also takes on reference value for index demonstration and design optimization for spectral instrument development.
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Yuheng Chen, Yuheng Chen, Xinhua Chen, Xinhua Chen, Jiankang Zhou, Jiankang Zhou, Yiqun Ji, Yiqun Ji, Weimin Shen, Weimin Shen, "Quality assessment for spectral imaging", Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 96860F (25 October 2016); doi: 10.1117/12.2240101; https://doi.org/10.1117/12.2240101
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