25 October 2016 Image metric analysis of laser jamming effect based on edge strength similarity and gray mean square error
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Proceedings Volume 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices; 96860O (2016) https://doi.org/10.1117/12.2243215
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China
Abstract
Laser jamming plays an important role in the countermeasure to optoelectronic imaging systems. The influence of laser jamming on optoelectronic imaging systems was introduced briefly. In order to evaluate the performance of laser jamming objectively, quantitatively and precisely, a comprehensive image metric combining the edge strength similarity(ESM) with gray mean square error(MSE) was proposed from the view of laser jamming images. The computation methods of edge strength similarity and gray mean square error were provided. The metric computed the edge strength similarity between target image and background image, and gray mean square error between target image and reference image comprehensively to evaluate the laser jamming performance quantitatively. Computing the edge strength similarity between target image and background image could be viewed as a local evaluation metric, and computing the ray mean square error between target image and reference image could be viewed as global evaluation metric. The two metric was combined to evaluate the performance of laser jamming comprehensively. Experimental results of laser jamming in and out the field of view showed that the proposed metric could realize quantitative appraisal of laser jamming performance on optoelectronic imaging systems.
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Li Shao, Li Shao, Yun-long Wu, Yun-long Wu, } "Image metric analysis of laser jamming effect based on edge strength similarity and gray mean square error", Proc. SPIE 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices, 96860O (25 October 2016); doi: 10.1117/12.2243215; https://doi.org/10.1117/12.2243215
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