How to specify super-smooth mirrors: simulation studies on nano-focusing and wavefront preserving x-ray mirrors for next-generation light sources

Xianbo Shi; Lahsen Assoufid; Ruben Reininger

doi:10.1117/12.2241139

25 October 2016 How to specify super-smooth mirrors: simulation studies on nano-focusing and wavefront preserving x-ray mirrors for next-generation light sources

Xianbo Shi, Lahsen Assoufid, Ruben Reininger

Author Affiliations +

Proceedings Volume 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics; 968703 (2016) https://doi.org/10.1117/12.2241139
Event: Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016), 2016, Suzhou, China

Abstract

The advent of high-brilliance synchrotron radiation sources with low emittance and high degree of coherence has urged the development of super-smooth x-ray mirrors, which have sub-nanometer height errors and sub-50-nrad slope errors. To ensure the optical performance and avoid procuring significantly more expensive mirrors than necessary, knowledge of the mirror surface power spectral density (PSD) function is required over a wide spatial frequency range. In addition, a better understanding of the diffraction effects of different spatial frequencies is required to guide the specification of the mirror in the beamline design phase. In this work, two typical x-ray beam focusing conditions for the proposed APS upgrade are studied: the diffraction limited focusing and the demagnification dominated focusing. The effects of surface errors are studied using both the method described by Church and Takacs¹ and numerical simulations with HYBRID². Using this information, we show how the mirror specification depends on the mirror PSD.

Citation Download Citation

Xianbo Shi, Lahsen Assoufid, and Ruben Reininger "How to specify super-smooth mirrors: simulation studies on nano-focusing and wavefront preserving x-ray mirrors for next-generation light sources", Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968703 (25 October 2016); https://doi.org/10.1117/12.2241139

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