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27 April 2016 Swept source quantitative phase imaging (Conference Presentation)
Yizheng Zhu, Shichao Chen
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Proceedings Volume 9713, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII; 97131H (2016) https://doi.org/10.1117/12.2213100
Event: SPIE BiOS, 2016, San Francisco, California, United States
Abstract
Holographic phase microscopy has seen rapid growth in the past two decades. Numerous schemes have been proposed and commercial products are now available. Since most systems are laser based, speckle noise and other non-signal interference in the system have been problematic, limiting the technique’s phase sensitivity, image quality and the ability for accurate quantitative analysis. Low coherence source-based HPM have also been proposed to mitigate this issue, but often with increased system complexity and reduced implementation flexibility. Here, we demonstrate a swept-source HPM technique, which acquires on-axis holograms while continuously scanning the laser through a range of wavelengths. This technique is capable of identifying interference from various sources and effectively isolating sample interference, therefore minimizing unwanted signals and achieving high spatial and temporal sensitivity across the entire field of view. The ability of acquiring spectral interferogram for each pixel also make it possible to implement spectral shaping, which can further suppress interference side-lobes and improve sensitivity. Additionally, when coupled with a spectral modulation technique, such interference spectrum will permit spectroscopic measurement of phase-related properties of the sample. We will introduce the principle of the system, discuss its theoretical sensitivity bound, and present its application to phase imaging of live cells.
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Yizheng Zhu and Shichao Chen "Swept source quantitative phase imaging (Conference Presentation)", Proc. SPIE 9713, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, 97131H (27 April 2016); https://doi.org/10.1117/12.2213100
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KEYWORDS
Phase imaging
High power microwaves
Microscopy
Holograms
Holography
Image quality
Laser systems engineering
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