Digital holographic phase microscopy is a well-established quantitative phase imaging technique. However, interference artifacts from inside the system, typically induced by elements whose optical thickness are within the source coherence length, limit the imaging quality as well as sensitivity. In this paper, a swept laser source based technique is presented. Spectra acquired at a number of wavelengths, after Fourier Transform, can be used to identify the sources of the interference artifacts. With proper tuning of the optical pathlength difference between sample and reference arms, it is possible to avoid these artifacts and achieve sensitivity below 0.3nm. Performance of the proposed technique is examined in live cell imaging.
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