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27 April 2016 Gradient light interference microscopy (GLIM) for imaging thick specimens (Conference Presentation)
Tan H. Nguyen, Mikhail E. Kandel, Gabriel Popescu
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Proceedings Volume 9718, Quantitative Phase Imaging II; 97182R (2016) https://doi.org/10.1117/12.2217294
Event: SPIE BiOS, 2016, San Francisco, California, United States
Abstract
Compared to the Phase Contrast, Differential Interference Contrast (DIC) has been known to give higher depth sectioning as well as a halo-free images when investigating transparent specimens. Thanks to relying on generating two slightly shifted replicas with a small amount of shift, within the coherence area, DIC is able to operate with very low coherence light. More importantly, the method is able to work with very large numerical aperture of the illumination, which offer comparable sectioning capability to bright field microscopy. However, DIC is still a qualitative method, which limits potential applications of the technique. In this paper, we introduce a method that extends the capability of DIC by combining it with a phase shifting module to extract the phase gradient information. A theoretical model of the image formation is developed and the possibility of integrating the gradient function is analyzed.. Our method is benchmarked on imaging embryos during their 7-day development, HeLa cells during mitosis, and control samples.
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View presentation recording on the SPIE Digital Library: http://dx.doi.org/10.1117/12.2217294.4848767858001
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Tan H. Nguyen, Mikhail E. Kandel, and Gabriel Popescu "Gradient light interference microscopy (GLIM) for imaging thick specimens (Conference Presentation)", Proc. SPIE 9718, Quantitative Phase Imaging II, 97182R (27 April 2016); https://doi.org/10.1117/12.2217294
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KEYWORDS
Digital image correlation
Microscopy
Data modeling
Image acquisition
Performance modeling
Phase contrast
Phase shifting
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