9 March 2016 Through-the-objective holographic surface plasmon resonance imaging for quantitative measurement of thin film thickness
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Proceedings Volume 9718, Quantitative Phase Imaging II; 97182W (2016) https://doi.org/10.1117/12.2218419
Event: SPIE BiOS, 2016, San Francisco, California, United States
Abstract
We built and tested a Holographic Surface Plasmon Resonance (HoloSPR) objective-based microscope for simultaneous amplitude-contrast and phase-contrast Surface Plasmon Resonance imaging (SPRi). SPRi is a widely spread tool for label-free detection of changes in refractive index and concentration, as well as mapping of thin films. However, to obtain quantitative data of thin film thickness, usually scanning techniques have to be employed. Thanks to the simultaneous detection of amplitude and phase, we show that HoloSPRi provides a versatile imaging tool for high-throughput SPR detection, which yields, moreover, the possibility of non-scanning quantitative measurements of thin film thickness.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Mandracchia, B. Mandracchia, V. Pagliarulo, V. Pagliarulo, M. Paturzo, M. Paturzo, P. Ferraro, P. Ferraro, "Through-the-objective holographic surface plasmon resonance imaging for quantitative measurement of thin film thickness", Proc. SPIE 9718, Quantitative Phase Imaging II, 97182W (9 March 2016); doi: 10.1117/12.2218419; https://doi.org/10.1117/12.2218419
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