Rapid stress-testing vs. long-term aging: a case study of 980-nm emitting single-spatial mode lasers

Jens W. Tomm; Martin Hempel; David Venables; Victor Rossin; Erik Zucker; Thomas Elsaesser

doi:10.1117/12.2208256

4 March 2016 Rapid stress-testing vs. long-term aging: a case study of 980-nm emitting single-spatial mode lasers

Jens W. Tomm, Martin Hempel, David Venables, Victor Rossin, Erik Zucker, Thomas Elsaesser

Proceedings Volume 9733, High-Power Diode Laser Technology and Applications XIV; 973303 (2016) https://doi.org/10.1117/12.2208256
Event: SPIE LASE, 2016, San Francisco, California, United States

Abstract

The degradation behaviors of 980-nm emitting nominally identical single-spatial mode lasers are studied during continuous wave long-term operation and during single-pulse stress tests. Both tests activate internal catastrophic optical damage as sudden degradation mechanism limiting the device lifetime. In case of high power stress-testing, the mechanism that initializes this effect is a spatial widening of the optical mode, resulting in increased absorption outside the waveguide. A similar disturbance to the optical mode is caused by defects that are generated during long-term operation. Thus two very different aging regimes eventually result in the same degradation scenario. We find that single-pulse stress-testing allows for activation of several degradation mechanisms in a device one after the other. Moreover, it becomes possible to distinguish between effects induced by gradual degradation and such that are independent on operation time. Thus stress-testing is considered a complementary tool, which might pave the way towards more economic device testing.

Citation Download Citation

Jens W. Tomm, Martin Hempel, David Venables, Victor Rossin, Erik Zucker, and Thomas Elsaesser "Rapid stress-testing vs. long-term aging: a case study of 980-nm emitting single-spatial mode lasers", Proc. SPIE 9733, High-Power Diode Laser Technology and Applications XIV, 973303 (4 March 2016); https://doi.org/10.1117/12.2208256

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