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25 February 2016 Atom-based RF electric field metrology above 100 GHz
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Abstract
Atom-based radio-frequency (RF) electric field probes have the potential to improve electric field measurements for a broad range of frequencies (from a few GHz to 100s of GHz) and field strengths (mV/m to kV/m). For these probes to become a common measurement method, their range must be extended to high frequency (>100 GHz) and low field strength regimes. We present SI-traceable electric field measurements of RF fields above 100 GHz, using Autler-Townes splitting of Rydberg electromagnetically-induced transparency in a rubidium (Rb) vapor. We also demonstrate several techniques, including RF detuning from resonance and enhanced absorption, for increasing the probe sensitivity.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matt T. Simons, Joshua A. Gordon, and Christopher L. Holloway "Atom-based RF electric field metrology above 100 GHz", Proc. SPIE 9747, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications IX, 97471F (25 February 2016); https://doi.org/10.1117/12.2213415
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