26 February 2016 Optical investigation of microscopic defect distribution in semi-polar (1-101 and 11-22) InGaN light-emitting diodes
Author Affiliations +
Abstract
Near-field scanning optical microscopy was applied to investigate the spatial variations of extended defects and their effects on the optical quality for semi-polar (1-101) and (11-22) InGaN light emitting diodes (LEDs). (1-101) and (11-22) oriented InGaN LEDs emitting at 450-470 nm were grown on patterned Si (001) 7° offcut substrates and m-sapphire substrates by means of nano-epitaxial lateral overgrowth (ELO), respectively. For (1-101) structures, the photoluminescence (PL) at 85 K from the near surface c+ wings was found to be relatively uniform and strong across the sample. However, emission from the c- wings was substantially weaker due to the presence of high density of threading dislocations (TDs) and basal plane stacking faults (BSFs) as revealed from the local PL spectra. In case of (11-22) LED structures, near-field PL intensity correlated with the surface features and the striations along the direction parallel to the c-axis projection exposed facets where the Indium content was higher as deduced from shift in the PL peak energy.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shopan Hafiz, Shopan Hafiz, Nicolas Andrade, Nicolas Andrade, Morteza Monavarian, Morteza Monavarian, Natalia Izyumskaya, Natalia Izyumskaya, Saikat Das, Saikat Das, Fan Zhang, Fan Zhang, Vitaliy Avrutin, Vitaliy Avrutin, Hadis Morkoç, Hadis Morkoç, Ümit Özgür, Ümit Özgür, } "Optical investigation of microscopic defect distribution in semi-polar (1-101 and 11-22) InGaN light-emitting diodes", Proc. SPIE 9748, Gallium Nitride Materials and Devices XI, 974828 (26 February 2016); doi: 10.1117/12.2213908; https://doi.org/10.1117/12.2213908
PROCEEDINGS
6 PAGES


SHARE
Back to Top