1 March 2016 Leaky waveguides for low ҡ-measurement: From structure design to loss evaluation
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Abstract
For high quality optical coatings the knowledge of the losses of the deposited materials is essential. A precise measurement of low Im(n+iκ)≤ 10-6 at an intended operation wavelength and with low intensity can be achieved in waveguide configurations, whereby leaky waveguide configurations allow one to analyze losses of high- and low-index media of H-L-stacks as well due to resonances in the angle-dependent reflection curve. Numerical investigations reveal that different leaky wave schemes, e.g. Bragg-, Bloch- and Antiresonant-Reflecting waveguides, comply differently with practical requests. Loss figure evaluation requires peculiar attention due to measurement accuracy and ambiguities, thus suitable constraints for layer data and a proper merit-function construction have to be used.
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Christoph Wächter, Riccardo Rizzo, Francesco Michelotti, Peter Munzert, and Norbert Danz "Leaky waveguides for low ҡ-measurement: From structure design to loss evaluation", Proc. SPIE 9750, Integrated Optics: Devices, Materials, and Technologies XX, 975019 (1 March 2016); doi: 10.1117/12.2208133; https://doi.org/10.1117/12.2208133
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