Paper
15 March 2016 VIS Fabry-Pérot-Interferometer with (HL)4 PE-Si3N4/PE-SiO2 reflectors on freestanding LP-Si3N4 membranes for surface enhanced Raman spectroscopy
Christian Helke, Marco Meinig, Mario Seifert, Jan Seiler, Karla Hiller, Steffen Kurth, Jörg Martin, Thomas Gessner
Author Affiliations +
Proceedings Volume 9760, MOEMS and Miniaturized Systems XV; 97600I (2016) https://doi.org/10.1117/12.2208567
Event: SPIE OPTO, 2016, San Francisco, California, United States
Abstract
Profound developments of miniaturized spectrometry systems enable new breakthrough applications such as online monitoring systems for specific molecules by Surface Enhanced Raman Spectroscopy (SERS). The spectrometry system is based on SERS active surfaces in-situ generating nanoparticles and miniaturized detectors with tunable Fabry-Pérot- Interferometers (FPI) with very sharp transmission peaks and a FWHM bandwidth below 2 nm. The key part of this online monitoring system is a tunable FPI, which is fabricated with MEMS technology. This contribution presents a 7.5 x 7.5 mm² chip size FPI, consisting of a moveable reflector on a 210 nm thin and up to 5.5 mm in diameter Si3N4 membrane on a silicon carrier, and a fixed reflector on glass. The optical resonator with an aperture of 2 mm diameter is designed for the central wavelength of 570 nm and realized by adhesive SU-8 bonding of the silicon on glass substrate. The moveable Si3N4 membrane is fabricated by combined wet and dry etching of silicon. The dielectric (HL)4 Si3N4/ SiO2 reflector stack with a reflectance of 93 % is deposited by PE-CVD on the LP-CVD-Si3N4 and structured by dry etching on the membrane and the glass. The measured peak transmittance is between 52 % and 74 % with a FWHM bandwidth between 1.3 nm and 2.0 nm. It was shown, that the FPIs are tunable over the spectral range from 555 nm to 585 nm which is relevant for this SERS application with a tuning voltage of 25 V.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian Helke, Marco Meinig, Mario Seifert, Jan Seiler, Karla Hiller, Steffen Kurth, Jörg Martin, and Thomas Gessner "VIS Fabry-Pérot-Interferometer with (HL)4 PE-Si3N4/PE-SiO2 reflectors on freestanding LP-Si3N4 membranes for surface enhanced Raman spectroscopy", Proc. SPIE 9760, MOEMS and Miniaturized Systems XV, 97600I (15 March 2016); https://doi.org/10.1117/12.2208567
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Cited by 2 scholarly publications.
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KEYWORDS
Reflectors

Silicon

Glasses

Reflectivity

Semiconducting wafers

Surface enhanced Raman spectroscopy

Aluminum

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