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4 March 2016 Photo-induced force for spectroscopic imaging at the nanoscale
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Proceedings Volume 9764, Complex Light and Optical Forces X; 97641J (2016) https://doi.org/10.1117/12.2208199
Event: SPIE OPTO, 2016, San Francisco, California, United States
Abstract
Photo-induced force microscopy (PiFM) is a new scan probe method that enables imaging with spectroscopic contrast at the nanoscale. The operating principle of PiFM is based on the coupling between a sharp atomic tip and a polarizable object, as mediated by the electromagnetic field in the vicinity of the tip-sample junction. In this contribution, we develop a description of the photo-induced force in the limit where the tip and object can be approximated as dipoles. This description provides an insightful picture of the forces at play in the tip-sample junction in terms of the gradient and scattering forces. We consider various approximations that are relevant to experimental conditions. The theoretical approach described here successfully explains the previous spectroscopic PiFM measurements in the visible and in the near-IR range, and the anticipated spectral information that can be retrieved under mid infrared illumination.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Junghoon Jahng, Faezeh Tork Ladani, Ryan Muhammad Khan, and Eric Olaf Potma "Photo-induced force for spectroscopic imaging at the nanoscale", Proc. SPIE 9764, Complex Light and Optical Forces X, 97641J (4 March 2016); https://doi.org/10.1117/12.2208199
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