7 March 2016 Nanoscale imaging of defects in layered liquid crystals
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Proceedings Volume 9769, Emerging Liquid Crystal Technologies XI; 97690D (2016) https://doi.org/10.1117/12.2216292
Event: SPIE OPTO, 2016, San Francisco, California, United States
Abstract
Topological defects determine many static and dynamic properties of liquid crystals. They are mainly studied by optical microscopy, which cannot reveal the detailed structure of the defect core, where the deformations are too strong to sustain the usual type of order. The size of the core in most of liquid crystals is in the range of 1-10 nanometers, which calls for imaging techniques with resolution much higher than the optical one. Here we summarize and discuss results of Transmission Electron Microscopy (TEM) nanoscale imaging of defects in several layered liquid crystals built of rod- and bent-shaped molecules. We will present and analyze structures of edge and screw dislocations, twist and tilt grain boundaries of smectic layers. Topological defects have large impact on optical properties of the LCs and understanding their nanoscale properties will help us structuring them for optical applications.
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C. Zhang, O. D. Lavrentovich, A. Jákli, "Nanoscale imaging of defects in layered liquid crystals", Proc. SPIE 9769, Emerging Liquid Crystal Technologies XI, 97690D (7 March 2016); doi: 10.1117/12.2216292; https://doi.org/10.1117/12.2216292
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