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7 March 2016 Emissive and reflective properties of curved displays in relation to image quality
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Proceedings Volume 9770, Advances in Display Technologies VI; 977002 (2016) https://doi.org/10.1117/12.2207850
Event: SPIE OPTO, 2016, San Francisco, California, United States
Abstract
Different aspects of the characterization of curved displays are presented. The limit of validity of viewing angle measurements without angular distortion on such displays using goniometer or Fourier optics viewing angle instrument is given. If the condition cannot be fulfilled the measurement can be corrected using a general angular distortion formula as demonstrated experimentally using a Samsung Galaxy S6 edge phone display. The reflective properties of the display are characterized by measuring the spectral BRDF using a multispectral Fourier optics viewing angle system. The surface of a curved OLED TV has been measured. The BDRF patterns show a mirror like behavior with and additional strong diffraction along the pixels lines and columns that affect the quality of the display when observed with parasitic lighting. These diffraction effects are very common on OLED surfaces. We finally introduce a commercial ray tracing software that can use directly the measured emissive and reflective properties of the display to make realistic simulation under any lighting environment.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Boher, Thierry Leroux, Thibault Bignon, Véronique Collomb-Patton, Pierre Blanc, and Etienne Sandré-Chardonnal "Emissive and reflective properties of curved displays in relation to image quality", Proc. SPIE 9770, Advances in Display Technologies VI, 977002 (7 March 2016); https://doi.org/10.1117/12.2207850
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