Paper
25 March 2016 Design of new block copolymer systems to achieve thick films with defect-free structures for applications of DSA into lithographic large nodes
X. Chevalier, P. Coupillaud, G. Lombard, C. Nicolet, J. Beausoleil, G. Fleury, M. Zelsmann, P. Bezard, G. Cunge, J. Berron, K. Sakavuyi, A. Gharbi, R. Tiron, G. Hadziioannou, C. Navarro, I. Cayrefourcq
Author Affiliations +
Abstract
Properties of new block copolymers systems, specifically designed to reach large periods for the features, are compared to the ones exhibited by classical PS-b-PMMA materials of same dimensions. Conducted studies, like free-surface defects analysis, mild-plasma tomography experiments, graphoepitaxy-guided structures, etch-transfer… indicate much better performances, in terms of achievable film-thicknesses with perpendicular features, defects levels, and dimensional uniformities, for the new system than for the classical PS-b-PMMA. These results clearly highlight unique and original solutions toward an early introduction of DSA technology into large lithographic nodes.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
X. Chevalier, P. Coupillaud, G. Lombard, C. Nicolet, J. Beausoleil, G. Fleury, M. Zelsmann, P. Bezard, G. Cunge, J. Berron, K. Sakavuyi, A. Gharbi, R. Tiron, G. Hadziioannou, C. Navarro, and I. Cayrefourcq "Design of new block copolymer systems to achieve thick films with defect-free structures for applications of DSA into lithographic large nodes", Proc. SPIE 9779, Advances in Patterning Materials and Processes XXXIII, 977913 (25 March 2016); https://doi.org/10.1117/12.2219214
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KEYWORDS
Lithography

Scanning electron microscopy

Molecular self-assembly

Directed self assembly

Etching

Plasma

Crystals

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