16 March 2016 Rapid recipe formulation for plasma etching of new materials
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A fast and inexpensive scheme for etch rate prediction using flexible continuum models and Bayesian statistics is demonstrated. Bulk etch rates of MgO are predicted using a steady-state model with volume-averaged plasma parameters and classical Langmuir surface kinetics. Plasma particle and surface kinetics are modeled within a global plasma framework using single component Metropolis Hastings methods and limited data. The accuracy of these predictions is evaluated with synthetic and experimental etch rate data for magnesium oxide in an ICP-RIE system. This approach is compared and superior to factorial models generated from JMP, a software package frequently employed for recipe creation and optimization.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Meghali Chopra, Meghali Chopra, Zizhuo Zhang, Zizhuo Zhang, John Ekerdt, John Ekerdt, Roger T. Bonnecaze, Roger T. Bonnecaze, "Rapid recipe formulation for plasma etching of new materials", Proc. SPIE 9781, Design-Process-Technology Co-optimization for Manufacturability X, 978111 (16 March 2016); doi: 10.1117/12.2219171; https://doi.org/10.1117/12.2219171


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