|
Pattern roughness is derived from the physical and chemical characteristics of these process steps. It is changing with each of the SAQP process steps, based on material stack and the etch process characteristics. Relative to a sub 10 nm pattern sizes pattern, edge roughness can significantly impact pattern physical dimensions. Unless controlled it can increase the variability of device electrical performance, and reduce yield. In this paper we present the SAQP process steps and roughness characterization, performed with Power Spectral Density (PSD) methodology. Experimental results demonstrates the ability of PSD analysis to sensitively reflect detailed characterization of process roughness, guiding process development improvements, and enabling roughness monitoring for production. |
ACCESS THE FULL ARTICLE
No SPIE Account? Create one
CITATIONS
Cited by 8 scholarly publications and 1 patent.
Line edge roughness
Etching
Line width roughness
Scanning electron microscopy
Edge roughness
Optical lithography
Signal to noise ratio
