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30 March 2016 Physical properties of a new flat panel detector with cesium-iodide technology
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Flat panel detectors have become the standard technology in projection radiography. Further progress in detector technology will result in an improvement of MTF and DQE. The new detector (DX-D45C; Agfa; Mortsel/Belgium) is based on cesium-iodine crystals and has a change in the detector material and the readout electronics. The detector has a size of 30 cm x 24 cm and a pixel matrix of 2560 x 2048 with a pixel pitch of 124 μm. The system includes an automatic exposure detector, which enables the use of the detector without a connection to the x-ray generator. The physical properties of the detector were determined following IEC 62220-1-1 in a laboratory setting. The MTF showed an improvement compared to the previous version of cesium-iodine based flat-panel detectors. Thereby the DQE is also improved especially for the higher frequencies. The new detector showed an improvement in the physical properties compared to the previous versions. This enables a potential for further dose reductions in clinical imaging.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Hahn, Petar Penchev, and Martin Fiebich "Physical properties of a new flat panel detector with cesium-iodide technology", Proc. SPIE 9783, Medical Imaging 2016: Physics of Medical Imaging, 97833V (30 March 2016);

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