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5 November 2015 Non-invasive detection of murals with pulsed terahertz reflected imaging system
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Proceedings Volume 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015; 979534 (2015) https://doi.org/10.1117/12.2210740
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015, 2015, Hefei, Suzhou, and Harbin, China
Abstract
Pulsed terahertz reflected imaging technology has been expected to have great potential for the non-invasive analysis of artworks. In this paper, three types of defects hidden in the plaster used to simulate the cases of defects in the murals, have been investigated by a pulsed terahertz reflected imaging system. These preset defects include a circular groove, a cross-shaped slit and a piece of “Y-type” metal plate built in the plaster. With the terahertz reflective tomography, information about defects has been determined involving the thickness from the surface of sample to the built-in defect, the profile and distribution of the defect. Additionally, three-dimensional analyses have been performed in order to reveal the internal structure of defects. Terahertz reflective imaging can be applied to the defect investigation of the murals.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Minjie Yuan, Wenfeng Sun, Xinke Wang, Jiasheng Ye, Sen Wang, Qunxi Zhang, and Yan Zhang "Non-invasive detection of murals with pulsed terahertz reflected imaging system", Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 979534 (5 November 2015); https://doi.org/10.1117/12.2210740
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