5 November 2015 Analysis of high voltage dielectric insulation materials of XLPE by THz-TDS system
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Proceedings Volume 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015; 97953G (2015) https://doi.org/10.1117/12.2213823
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015, 2015, Hefei, Suzhou, and Harbin, China
Abstract
In this paper, cross-linked polyethylene (XLPE) was analyzed by THz time domain spectroscopy (TDS) system at room temperature. By recording time domain signal of terahertz radiation field, frequency spectrum can be obtained by Fourier transform. Then the refractive index and dielectric constant in THz band are calculated. This proves that the THz-TDS system has a potential application for detecting the aging characteristic of XLPE.
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Wei Shi, Zhijin Yan, Lei Yang, Yang Dai, Like Zhang, Kangkang Bian, Lei Hou, "Analysis of high voltage dielectric insulation materials of XLPE by THz-TDS system", Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97953G (5 November 2015); doi: 10.1117/12.2213823; https://doi.org/10.1117/12.2213823
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