5 November 2015 Terahertz metrology on power, frequency, spectroscopy, and pulse parameters
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Proceedings Volume 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015; 97953L (2015) https://doi.org/10.1117/12.2214929
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015, 2015, Hefei, Suzhou, and Harbin, China
Abstract
Terahertz metrology is becoming more and more important along with the fast development of terahertz technology. This paper reviews the research works of the groups from the physikalisch-technische bundesanstalt (PTB), National institute of standards and technology (NIST), National physical laboratory (NPL), National institute of metrology (NIM) and some other research institutes. The contents mainly focus on the metrology of parameters of power, frequency, spectrum and pulse. At the end of the paper, the prospect of terahertz metrology is predicted.
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Bin Wu, Bin Wu, Cheng Ping Ying, Cheng Ping Ying, Heng Fei Wang, Heng Fei Wang, Peng Zhang, Peng Zhang, Hong Yuan Liu, Hong Yuan Liu, Bin Jiang, Bin Jiang, "Terahertz metrology on power, frequency, spectroscopy, and pulse parameters", Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97953L (5 November 2015); doi: 10.1117/12.2214929; https://doi.org/10.1117/12.2214929
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