26 March 2016 Information measurement system based on the device for evaluation of optical surface quality
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Proceedings Volume 9807, Optical Technologies for Telecommunications 2015; 980714 (2016) https://doi.org/10.1117/12.2235316
Event: XIII International Scientific and Technical Conference on Optical Technologies in Telecommunications, 2015, Ufa, Russian Federation
Abstract
The work describes steps taken in order to create the information-measurement system based on the device for evaluation of surface cleanliness and smoothness of optical substrates. The approach used leads to the improvement the stability and accuracy of measurements. Structural changes applied to both the software and hardware of the device which allowed retrieval of better quality images during the course of measurements are designated. Problems emerged during the implementation of the system and their solutions are described.
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Pavel Y. Izotov, Pavel Y. Izotov, } "Information measurement system based on the device for evaluation of optical surface quality", Proc. SPIE 9807, Optical Technologies for Telecommunications 2015, 980714 (26 March 2016); doi: 10.1117/12.2235316; https://doi.org/10.1117/12.2235316
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