30 November 2015 Bi/Si interface and Bi nanolines characterization by surface differential reflectivity
Author Affiliations +
Proceedings Volume 9809, Twelfth International Conference on Correlation Optics; 98090N (2015) https://doi.org/10.1117/12.2218069
Event: 12th International Conference on Correlation Optics, 2015, Chernivsti, Ukraine
Abstract
The influence of Bi/Si(001) interfaces and Bi nanolines on Si(001) surface on the reflectance properties of two-phase systems is discussed in ultra-high vacuum, by means of two different surface optical spectroscopies: the Surface Differential Reflectance Spectroscopy and the Reflectance Anisotropy Spectroscopy. Specific spectra are obtained, which are interpreted as a function of the surface modification mode. In particular, it is possible to discriminate between Bi/Si interfaces with different thickness and Bi nanolines on Si surface. Moreover, quantitative information is proposed from these optical techniques which yields the determination of the number (or concentration) of surface Si and Bi atoms involved in the bonding.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Viktor V. Buchenko, Viktor V. Buchenko, Andrey A. Goloborodko, Andrey A. Goloborodko, "Bi/Si interface and Bi nanolines characterization by surface differential reflectivity", Proc. SPIE 9809, Twelfth International Conference on Correlation Optics, 98090N (30 November 2015); doi: 10.1117/12.2218069; https://doi.org/10.1117/12.2218069
PROCEEDINGS
7 PAGES


SHARE
Back to Top