20 May 2016 Type-II superlattice infrared detector technology at Fraunhofer IAF
Author Affiliations +
For more than two decades, Antimony-based type-II superlattice photodetectors for the infrared spectral range between 3-15 μm are under development at the Fraunhofer Institute for Applied Solid State Physics (IAF). Today, Fraunhofer IAF is Germany’s only national foundry for InAs/GaSb type-II superlattice detectors and we cover a wide range of aspects from basic materials research to small series production in this field. We develop single-element photodetectors for sensing systems as well as two-dimensional detector arrays for high-performance imaging and threat warning systems in the mid-wavelength and long-wavelength region of the thermal infrared. We continuously enhance our production capabilities by extending our in-line process control facilities. As a recent example, we present a semiautomatic wafer probe station that has developed into an important tool for electrooptical characterization. A large amount of the basic materials research focuses on the reduction of the dark current by the development of bandgap engineered device designs on the basis of heterojunction concepts. Recently, we have successfully demonstrated Europe’s first LWIR InAs/GaSb type-II superlattice imager with 640x512 pixels with 15 μm pitch. The demonstrator camera already delivers a good image quality and achieves a thermal resolution better than 30 mK.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Rehm, Robert Rehm, Volker Daumer, Volker Daumer, Tsvetelina Hugger, Tsvetelina Hugger, Norbert Kohn, Norbert Kohn, Wolfgang Luppold, Wolfgang Luppold, Raphael Müller, Raphael Müller, Jasmin Niemasz, Jasmin Niemasz, Johannes Schmidt, Johannes Schmidt, Frank Rutz, Frank Rutz, Tim Stadelmann, Tim Stadelmann, Matthias Wauro, Matthias Wauro, Andreas Wörl, Andreas Wörl, "Type-II superlattice infrared detector technology at Fraunhofer IAF", Proc. SPIE 9819, Infrared Technology and Applications XLII, 98190X (20 May 2016); doi: 10.1117/12.2223887; https://doi.org/10.1117/12.2223887

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