Measured system component development for the night vision integrated performance model (NV-IPM)

Brian P. Teaney; David P. Haefner

doi:10.1117/12.2224734

3 May 2016 Measured system component development for the night vision integrated performance model (NV-IPM)

Brian P. Teaney, David P. Haefner

Proceedings Volume 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII; 982007 (2016) https://doi.org/10.1117/12.2224734
Event: SPIE Defense + Security, 2016, Baltimore, MD, United States

Abstract

The Night Vision Integrated Performance Model (NV-IPM) introduced a variety of measured system components in version 1.6 of the model. These measured system components enable the characterization of systems based on lab measurements which treat the system as a ‘black-box.’ This encapsulation of individual component terms into higher level measurable quantities circumvents the need to develop costly, time-consuming measurement techniques for each individual input term. Each of the ‘black-box’ system components were developed based upon the minimum required system level measurements for a particular type of imaging system. The measured system hierarchy also includes components for cases where a very limited number of measurements are possible. We discuss the development of the measured system components, the transition of lab measurements into model inputs, and any assumptions inherent to this process.

Citation Download Citation

Brian P. Teaney and David P. Haefner "Measured system component development for the night vision integrated performance model (NV-IPM)", Proc. SPIE 9820, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII, 982007 (3 May 2016); https://doi.org/10.1117/12.2224734

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