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Evaluation of chalcogenide glasses for multispectral imaging in the visible, SWIR and LWIR spectral regions
High accuracy refractive index measurement system for germanium and silicon using the channelled spectrum method in the range of 3 to 15 μm
Characterization of the image quality of a wide angle MWIR f-theta objective lens by means of pixel contrast
Experimental verification of the minimum number of diffractive zones for effective chromatic correction in the LWIR
Ultra-narrow bandpass filters for infrared applications with improved angle of incidence performance