20 April 2016 A new clustering algorithm for scanning electron microscope images
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A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with the sample atoms, producing various signals that are collected by detectors. The gathered signals contain information about the sample’s surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam’s position is combined with the detected signal to produce an image. The most common configuration for an SEM produces a single value per pixel, with the results usually rendered as grayscale images. The captured images may be produced with insufficient brightness, anomalous contrast, jagged edges, and poor quality due to low signal-to-noise ratio, grained topography and poor surface details. The segmentation of the SEM images is a tackling problems in the presence of the previously mentioned distortions. In this paper, we are stressing on the clustering of these type of images. In that sense, we evaluate the performance of the well-known unsupervised clustering and classification techniques such as connectivity based clustering (hierarchical clustering), centroid-based clustering, distribution-based clustering and density-based clustering. Furthermore, we propose a new spatial fuzzy clustering technique that works efficiently on this type of images and compare its results against these regular techniques in terms of clustering validation metrics.
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Amr Yousef, Amr Yousef, Prakash Duraisamy, Prakash Duraisamy, Mohammad Karim, Mohammad Karim, "A new clustering algorithm for scanning electron microscope images", Proc. SPIE 9845, Optical Pattern Recognition XXVII, 984509 (20 April 2016); doi: 10.1117/12.2224251; https://doi.org/10.1117/12.2224251


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