26 May 2016 Overview of detector technologies for EO/IR sensing applications
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Abstract
Optical sensing technology is critical for optical communication, defense and security applications. Advances in optoelectronics materials in the UV, Visible and Infrared, using nanostructures, and use of novel materials such as CNT and Graphene have opened doors for new approaches to apply device design methodology that are expected to offer enhanced performance and low cost optical sensors in a wide range of applications. This paper is intended to review recent advancements and present different device architectures and analysis. The chapter will briefly introduce the basics of UV and Infrared detection physics and various wave bands of interest and their characteristics [1, 2] We will cover the UV band (200-400 nm) and address some of the recent advances in nanostructures growth and characterization using ZnO/MgZnO based technologies and their applications. Recent advancements in design and development of CNT and Graphene based detection technologies have shown promise for optical sensor applications. We will present theoretical and experimental results on these device and their potential applications in various bands of interest.
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Ashok K. Sood, John W. Zeller, Roger E. Welser, Yash R. Puri, Jay S. Lewis, Nibir K. Dhar, Priyalal Wijewarnasuriya, "Overview of detector technologies for EO/IR sensing applications", Proc. SPIE 9854, Image Sensing Technologies: Materials, Devices, Systems, and Applications III, 98540A (26 May 2016); doi: 10.1117/12.2229420; https://doi.org/10.1117/12.2229420
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