Active thermal NDT: problems and solutions

V. P. Vavilov

doi:10.1117/12.2222980

11 May 2016 Active thermal NDT: problems and solutions

V. P. Vavilov

Author Affiliations +

Proceedings Volume 9861, Thermosense: Thermal Infrared Applications XXXVIII; 98610I (2016) https://doi.org/10.1117/12.2222980
Event: SPIE Commercial + Scientific Sensing and Imaging, 2016, Baltimore, MD, United States

Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

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V. P. Vavilov "Active thermal NDT: problems and solutions", Proc. SPIE 9861, Thermosense: Thermal Infrared Applications XXXVIII, 98610I (11 May 2016); https://doi.org/10.1117/12.2222980

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