Independent component analysis for improving the quality of interferometric products

A. Saqellari Likoka; E. Vafeiadi-Bila; V. Karathanassi

doi:10.1117/12.2224949

26 May 2016 Independent component analysis for improving the quality of interferometric products

A. Saqellari Likoka, E. Vafeiadi-Bila, V. Karathanassi

Proceedings Volume 9870, Computational Imaging; 987007 (2016) https://doi.org/10.1117/12.2224949
Event: SPIE Commercial + Scientific Sensing and Imaging, 2016, Baltimore, MD, United States

Abstract

The accuracy of InSAR DEMs is affected by the temporal decorrelation of SAR images which is due to atmosphere, land use/cover, soil moisture, and roughness changes. Elimination of the temporal decorrelation of the master and slave image improves the DEMs accuracy. In this study, the Independent Component Analysis was applied before interferometric process. It was observed that using three ICA entries, ICA independent sources can be interpreted as background and changed images. ICA when performed on the master and slave images using the same couple of additional images produces two background images which enable the production of high quality DEMs. However, limitations exist in the proposed approach.

Citation Download Citation

A. Saqellari Likoka, E. Vafeiadi-Bila, and V. Karathanassi "Independent component analysis for improving the quality of interferometric products", Proc. SPIE 9870, Computational Imaging, 987007 (26 May 2016); https://doi.org/10.1117/12.2224949

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