8 December 2015 Model selection for anomaly detection
Author Affiliations +
Proceedings Volume 9875, Eighth International Conference on Machine Vision (ICMV 2015); 987525 (2015) https://doi.org/10.1117/12.2228794
Event: Eighth International Conference on Machine Vision, 2015, Barcelona, Spain
Abstract
Anomaly detection based on one-class classification algorithms is broadly used in many applied domains like image processing (e.g. detection of whether a patient is “cancerous” or “healthy” from mammography image), network intrusion detection, etc. Performance of an anomaly detection algorithm crucially depends on a kernel, used to measure similarity in a feature space. The standard approaches (e.g. cross-validation) for kernel selection, used in two-class classification problems, can not be used directly due to the specific nature of a data (absence of a second, abnormal, class data). In this paper we generalize several kernel selection methods from binary-class case to the case of one-class classification and perform extensive comparison of these approaches using both synthetic and real-world data.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Burnaev, P. Erofeev, D. Smolyakov, "Model selection for anomaly detection", Proc. SPIE 9875, Eighth International Conference on Machine Vision (ICMV 2015), 987525 (8 December 2015); doi: 10.1117/12.2228794; https://doi.org/10.1117/12.2228794
PROCEEDINGS
6 PAGES


SHARE
Back to Top