17 May 2016 Front Matter: Volume 9890
This PDF file contains the front matter associated with SPIE Proceedings Volume 9890, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

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Author(s), “Title of Paper,” in Optical Micro- and Nanometrology VI, edited by Christophe Gorecki, Anand Krishna Asundi, Wolfgang Osten, Proceedings of SPIE Vol. 9890 (SPIE, Bellingham, WA, 2016) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510601352

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a six-digit CID article numbering system structured as follows:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc.

Albero, Jorge, 0C, 0D, 11

Anstotz, Freddy, 0E, 0G

Artigas, R., 0B

Assmann, Heiko, 0R (NA)

Badham, Katherine, 0T

Bai, Benfeng, 0P, 0W

Bargiel, Sylwester, 0C, 0D, 11

Baselt, Tobias, 0R (NA)

Bauer, J., 09, 15

Bittkau, K., 0J

Blondeau, J., 09

Bruce, Neil C., 12

Burger, M., 09

Büttner, Lars, 05, 0L

Cadenbach, T., 0N

Cadevall, C., 0B

Cao, Z., 0J

Cardenas, J. F., 0N

Carius, R., 0J

Claveau, R., 0E, 0Q

Costa-Vera, C., 0N

Cottrell, Don M., 0T

Czarske, Jürgen W., 05, 0A, 0L

Davis, Jeffrey A., 0T

Debailleul, Matthieu, 0G

Demoli, Nazif, 03 (NA)

Dohet-Eraly, Jérôme, 04

Dubois, Frank, 04

Dudek, Michal, 1D

El Mallahi, Ahmed, 04

Elyashevich, Galina K., 16

Enderlein, Tom, 11

Ezhova, Ksenia V., 16

Ferraro, P., 02

Fischer, Andreas, 0A

Flury, M., 0E, 0Q

Franta, Daniel, 14

Franz, M., 09

Fregin, B., 0L

Frenner, Karsten, 0I, 0M

Froehly, Luc, 0C, 0D, 1A

Froemel, Joerg, 11

Fu, Liwei, 0I

Fursenko, O., 15

Gessner, Thomas, 11

Giglia, Angelo, 14

Gödecke, M. L., 0M

Gorecki, Christophe, 0C, 0D, 11, 1A

Greiner, Andreas, 0R (NA)

Grieshober, K., 09

Haeberlé, Olivier, 0G

Hagemeier, Sebastian, 0X

Hanson, S. G., 0S

Hartmann, Peter,

Haufe, Daniel, 05

Hillmer, Harmut, 0X

Hyun, SangWon, 18

Jakobsen, M. L., 0S

Jaroszewicz, Leszek R., 1D

Jeon, WooKyung, 18

Kettel, Johannes, 08

Kim, ByoungChang, 18

Kim, ChangKyu, 18

Kim, GeonHee, 18

Kim, IJong, 18

Kim, Seunghyun, 18

Koch, Edmund, 0R (NA)

Koenig, J., 0L

Kostencka, J., 0F

Koukourakis, Nektarios, 05, 0A, 0L

Kozacki, T., 0F

Krauter, Johann, 0C

Krzeminski, Jakub, 0K

Kujawinska, Malgorzata, 1D

Kumar, Manoj, 07

Kuryndin, Ivan S., 16

Lardet-Vieudrin, Franck, 0D

Larsen, H. E., 0S

Lee, HyungSuk, 18

Lee, SeongWon, 18

Lehmann, Peter, 0X

Lehnen, S., 0J

Lemoal, Patrice, 0D

Leong-Hoï, Audrey, 0E, 0G

Li, Huiyu, 0I

Liu, Hui, 0G

Liu, Wenqi, 0P

Lorenc, Zofia, 0K

Lullin, Justine, 0C, 0D, 11

Makowski, Piotr, 1D

Mariné, J., 0B

Marschmeyer, S., 15

Matilla, A., 0B

Meguellati, S., 13

Mendoza Santoyo, Fernando, 06

Miccio, L., 02

Montaner, D., 0Q

Montgomery, Paul C., 0E, 0G, 0Q

Moreno, Ignacio, 0T

Mouti, S., 09

Müller, Claas, 08

Necas, David, 14

Nelsen, Bryan L., 0R (NA)

Ohlídal, Ivan, 14

Olesen, A. S., 0S

Osten, Wolfgang, 0C, 0I, 0M

Pagliarulo, V., 02

Parat, Vincent, 1D

Park, TaeJin, 18

Passilly, Nicolas, 0C, 0D, 11, 1A

Patorski, Krzysztof, 0V

Pavicic, Mladen, 03 (NA)

Paz, J. L., 0N

Pedersen, H. C., 0S

Pedersen, T. F., 0S

Pérez, J., 0B

Perrin, Stéphane, 0C, 0D, 1A

Peterhänsel, S., 0M

Philipp, Katrin, 0A

Pobiedina, Valentyna, 0O

Pulwer, S., 09

Rautenberg, J., 09

Reinecke, Holger, 08

Rodríguez-Núñez, O., 12

Salbut, Leszek, 0K

Sánchez-López, Maria M., 0T

Schrader, S., 09

Serio, B., 0E

Shakher, Chandra, 07

Simon, Bertrand, 0G

Skenderovic, Hrvoje, 03 (NA)

Sluzewski, Lukasz, 0V

Smolarski, André, 0A

Steglich, P., 09

Stipcevic, Mario, 03 (NA)

Stubager, J., 0S

Strmer, Moritz, 0A

Sunderland, Zofia, 0V

Swirniak, Grzegorz, 1B

Taudt, Christopher, 0R (NA)

Trusiak, Maciej, 0V

Uhring, W., 0E

Villringer, C., 09

Voelkl, Edgar, 06

Wallrabe, Ulricke, 0A

Wang, Qixia, 0W

Wang, Wei-Shan, 0C, 11

Wiemer, Maik, 0C, 11

Wirth, F., 09

Woidt, Carsten, 0X

Wroblewski, Grzegorz, 0K

Wu, Xiaochun, 0P

Wu, Xiaoyu, 0W

Xie, Weichang, 0X

Yakunov, Andrey, 0O

Yang, Guoce, 0P

You, Oubo, 0W

Yourassowsky, Catherine, 04

Zhang, S.-L., 0N

Zhang, Z.-B., 0N

Zhu, Zhendong, 0W

Zinchik, Alexander A., 16

Conference Committee

  • Symposium Chairs

    • Francis Berghmans, Vrije Universiteit Brussel (Belgium)

    • Jürgen Popp, Institut für Photonische Technologien e.V. (Germany)

    • Ronan Burgess, European Commission Photonics Unit (Belgium)

    • Peter Hartmann, SCHOTT AG (Germany)

  • Honorary Symposium Chair

    • Hugo Thienpont, Vrije Universiteit Brussel (Belgium)

  • Conference Chairs

    • Christophe Gorecki, FEMTO-ST (France)

    • Anand Krishna Asundi, Nanyang Technological University (Singapore)

    • Wolfgang Osten, Institut für Technische Optik (Germany)

  • Conference Program Committee

    • Jürgen W. Czarske, Technische Universität Dresden (Germany)

    • Peter J. de Groot, Zygo Corporation (United States)

    • Konstantinos Falaggis, Warsaw University of Technology (Poland)

    • Pietro Ferraro, Istituto Nazionale di Ottica (Italy)

    • Cosme Furlong, Worcester Polytechnic Institute (United States)

    • Yoshio Hayasaki, Utsunomiya University (Japan)

    • Peter H. Lehmann, Universität Kassel (Germany)

    • Andreas Ostendorf, Ruhr-Universität Bochum (Germany)

    • Yukitoshi Otani, Utsunomiya University (Japan)

    • Heidi Ottevaere, Vrije Universiteit Brussel (Belgium)

    • Nicolas Passilly, FEMTO-ST (France)

    • Christof Pruss, Universität Stuttgart (Germany)

    • Xiaocong Yuan, Nankai University (China)

    • Huimin Xie, Tsinghua University (China)

  • Session Chairs

    • 1 Digital Holography

      Wolfgang Osten, Universität Stuttgart (Germany)

    • 2 3D Metrology

      Jürgen W. Czarske, Technische Universität Dresden (Germany)

    • 3 Optical Tomography

      Christophe Gorecki, FEMTO-ST (France)

    • 4 Nanoscale Metrology, Nanoimaging, and Near-field Microscopy

      Heidi Ottevaere, Vrije Universteit Brussels (Belgium)

    • 5 Scatterometry

      Fernando Mendoz-Santoyo, Centro de Investigaciones en Óptica,

    • A.C. (Mexico)

    • 6 Topography and Surface Measurements

      Nazif Demoli, Institut za Fiziku(Croatia)

    • 7 Specialized Techniques

      Nicolas Passilly, FEMTO-ST (France)

    • 8 Interferometry Applications

      Anand Krishna Asundi, Nanyang Technological University (Singapore)

© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9890", Proc. SPIE 9890, Optical Micro- and Nanometrology VI, 989001 (17 May 2016); doi: 10.1117/12.2243899; https://doi.org/10.1117/12.2243899

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